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Refractive-index and thickness sensitivity in surface plasmon resonance spectroscopy

机译：表面等离子体共振光谱中的折射率和厚度灵敏度

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摘要

The sensitivities of surface plasmon resonance spectroscopy were examined at incident angles of 66-76 deg. The sensitivities were calculated for various refractive indices of liquid samples and for various thicknezses of deposited dielectric thin layers. Furthermore, the sensitivities were confirmed experimentally. The experimentally measured refractive indices and thicknesses were 1.3311-1.3463 and 0-89 nm, respectively. From these results it was demonstrated that the sensing system showed higher sensitivities with smaller incident angles. For example, the sensitivity for a refractive index at a 66° incident angle was seven times larger than that at 76°. It was also demonstrated that the resonant wavelength bas a linear relation to the refractive index and the thickness at refractive indices and thicknesses of 1.33-1.345 and 0-100 nm, respectively, except for a 66° incident angle.
机译：在66-76度的入射角下检查了表面等离子体共振光谱的灵敏度。针对液体样品的各种折射率和沉积的电介质薄层的各种厚度计算灵敏度。此外，通过实验确定了敏感性。实验测量的折射率和厚度分别为1.3311-1.3463和0-89 nm。从这些结果表明，传感系统在较小的入射角下显示出较高的灵敏度。例如，在66°入射角时的折射率灵敏度比在76°时高7倍。还证明了谐振波长与折射率和厚度呈线性关系，除了66°入射角外，折射率和折射率分别为1.33-1.345和0-100 nm。

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