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Control of the responsivity and the detectivity of superconductive edge-transition YBa_(2)Cu_(3)O_(7-x) bolometers through substrate properties

机译:通过基板特性控制超导边缘跃迁YBa_(2)Cu_(3)O_(7-x)辐射热计的响应度和检测率

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摘要

The detectivity D* limits of YBa_(2)Cu_(3)O_(7 - x) bolometers on 0.05-cm-thick crystalline substrates are inves-tigated, and a method to increase D* to greater than 10~(9) (cm Hz~(1/2))/W at a 20-μm wavelength is proposed. Because the response increases proportionally with the bias current I_(b), whereas the noise near T_(c) (the transition or critical temperature) of our MgO and SrTiO_(3) substrate samples does not, an increase in D* of these samples is obtained by an increase in I_(b). Another limiting factor is the dc thermal conductance G(0) of the device, which, although controlled by the substrate-holder thermal boundary resistance for our samples, can be changed by means of thinning the substrate to increase D*. The optimal amount of thinning depends on the substrate's thermal parameters and the radiation modulation frequency. D* in our samples is also found to follow the spectral-radiation absorption of the substrate material.
机译:研究了YBa_(2)Cu_(3)O_(7-x)辐射热计在0.05厘米厚的晶体基板上的D *检出限,并提出了一种将D *增加至大于10〜(9)的方法(提出了在20μm波长下为cm Hz〜(1/2))/ W。因为响应与偏置电流I_(b)成比例地增加,而我们的MgO和SrTiO_(3)衬底样品的T_(c)附近(转变温度或临界温度)附近的噪声却没有,所以这些样品的D *增加通过增加I_(b)获得。另一个限制因素是设备的直流导热系数G(0),尽管受样品的基板支架热边界电阻控制,但可以通过减薄基板以增加D *的方式进行更改。最佳减薄量取决于基材的热参数和辐射调制频率。我们的样品中的D *也被发现遵循衬底材料的光谱辐射吸收。

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