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Analysis of optical elements with the local plane-interface approximation

机译:用局部平面界面近似分析光学元件

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The local plane-interface approximation (LPIA) is a method for propagating electromagnetic fields through the inhomogeneous regions (e.g., elements) of an optical system. The LPIA is the superclass of all approximations that replace the usually curved optical interfaces with local tangential planes. Therefore the LPIA is restricted to smooth optical surfaces. A maximum radius of curvature of the optical interface of the order of a few wavelengths is a rough estimate for the validity of the LPIA. Two important approximation levels of the LPIA are the thin-element approximation (TEA) and a geometricoptical version of the LPIA (LPIA_(ray)). The latter combines the wave-optical propagation of an electromagnetic field in the homogeneous region of an optical system with a ray-tracing step in the inhomogeneous region. We discuss the regions of validity of the LPIA in general and the approximation levels LPIA_(ray) and TEA in detail.
机译:局部平面界面近似(LPIA)是一种用于传播电磁场通过光学系统的不均匀区域(例如,元件)的方法。 LPIA是所有近似的超类,它们用局部切平面代替了通常弯曲的光学接口。因此,LPIA限于光滑的光学表面。几个波长量级的光学接口的最大曲率半径是LPIA有效性的粗略估计。 LPIA的两个重要的近似级别是薄元素近似(TEA)和LPIA的几何光学版本(LPIA_(ray))。后者将光学系统的均匀区域中电磁场的波光传播与非均匀区域中的光线跟踪步骤结合在一起。我们一般讨论LPIA的有效性区域,并详细讨论近似水平LPIA_(ray)和TEA。

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