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Measurement of transparent plates with wavelength-tuned phase-shifting interferometry

机译:用波长调谐相移干涉法测量透明板

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摘要

A wavelength-tuned Fizeau interferometer is applied to the problem of flatness testing of transparent plates. When the plate is positioned at a specific distance from the reference surface and an integermath 13-frame phase-shifting algorithm is applied, the system directly filters out unwanted interference arising from backsurface reflections. The resulting front-surface profile exhibits less than 2 nm of residual error attributable to spurious reflections from within the plate.
机译:波长调谐的Fizeau干涉仪用于解决透明板的平面度问题。当将板放置在距参考表面特定距离的位置,并应用整数13帧相移算法时,系统会直接滤除由于背面反射而产生的有害干扰。所得的前表面轮廓显示出小于2 nm的残留误差,该误差归因于板内部的寄生反射。

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