Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis

Lai TS; Lin WZ

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Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis

机译：可记录的景深和在线远场全息术中允许的最远距离，用于微对象分析

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摘要

We have obtained, based on the general irradiance distribution of in-line far-field holography, analytical solutions of the recordable depth of view (RDV) and the allowable farthest far-field distance (AFFD) of the in-line far-field holography for different illumination modes. The analytical solutions of RDV and AFFD show that AFFD cannot be limited if micro-objects are positioned in one special space and illuminated with convergent beams, but the RDV is not improved simultaneously. When micro-objects are placed in another special space and illuminated with a divergent beam, the RDV and AFFD can be improved simultaneously, but the recordable object space is split into two subspaces. These results are important in the design of a holographic recording system. (C) 1997 Optical Society of America.

机译：根据在线远场全息的一般辐照度分布，我们获得了在线远场全息的可记录景深（RDV）和可允许的最远距离（AFFD）的解析解。适用于不同的照明模式。 RDV和AFFD的解析解表明，如果将微物体放在一个特殊的空间中并用会聚光束照射，AFFD不会受到限制，但是RDV不能同时提高。将微对象放置在另一个特殊空间中并用发散光束照射时，可以同时改进RDV和AFFD，但可记录的对象空间分为两个子空间。这些结果在全息记录系统的设计中很重要。（C）1997年美国眼镜学会。

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《Applied optics》 |1997年第19期|共6页
作者
Lai TS; Lin WZ;
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正文语种 eng
中图分类光学;
关键词
particle-field holography; in-line holography; particle size analysis; recordable depth of view; FRAUNHOFER HOLOGRAPHY; SIZE;

机译：粒子场全息照相;在线全息照相;粒度分析;可记录的景深;弗劳霍夫全息术;尺寸;

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1. Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis [J] . Lai TS, Lin WZ Applied optics . 1997,第19期

机译：可记录的景深和在线远场全息术中允许的最远距离，用于微对象分析
2. Numerical suppression of the twin image in in-line holography of a volume of micro-objects [J] . L Denis, C Fournier, T Fournel, Measurement Science & Technology . 2008,第7期

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4. Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis [C] . Tianshu Lai, Zhongshan Univ., Guangzhou Guangdong, Practical Holography XI and Holographic Materials III . 1997

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Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis

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