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首页> 外文期刊>Applied optics >Measurements of the phase shift on reflection for low-order infrared Fabry-Perot interferometer dielectric stack mirrors
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Measurements of the phase shift on reflection for low-order infrared Fabry-Perot interferometer dielectric stack mirrors

机译：低阶红外法布里-珀罗干涉仪介电堆叠反射镜反射相移的测量

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摘要

A simple technique based on a Fizeau interferometer to measure the absolute phase shift on reflection for a Fabry-Perot interferometer dielectric stack mirror is described. Excellent agreement between the measured and predicted phase shift on reflection was found. Also described are the salient features of low-order Fabry-Perot interferometers and the demonstration of a near ideal low-order (1-10) Fabry-Perot interferometer through minimizing the phase dispersion on reflection of the dielectric stack. This near ideal performance of a low-order Fabry-Perot interferometer should enable several applications such as compact spectral imagers for solid and gas detection. The large free spectral range of such systems combined with an active control system will also allow simple interactive tuning of wavelength agile laser sources such as CO2 lasers, external cavity diode lasers, and optical parametric oscillators. (C) 1997 Optical Society of America.
机译：描述了一种基于Fizeau干涉仪的简单技术，用于测量Fabry-Perot干涉仪介电堆栈镜的反射时的绝对相移。发现反射的测量相移和预测相移之间极佳的一致性。还介绍了低阶Fabry-Perot干涉仪的显着特征，以及通过最小化电介质叠层反射时的相位色散来演示接近理想的低阶（1-10）Fabry-Perot干涉仪的演示。低阶Fabry-Perot干涉仪的这种近乎理想的性能应能实现多种应用，例如用于固体和气体检测的紧凑型光谱成像仪。与主动控制系统结合的此类系统的大自由光谱范围还将允许对波长捷变激光源（例如CO2激光器，外腔二极管激光器和光学参量振荡器）进行简单的交互式调整。 （C）1997年美国眼镜学会。

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