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Instrument line shape of Fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis detectors

机译:傅里叶变换光谱仪的仪器线形:非均匀照明离轴探测器的解析解

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摘要

A simple and powerful method for obtaining analytic instrument line shapes (ILS's) for Fourier transform spectrometers is explained. ILS's for off-axis circular and rectangular detectors are calculated to illustrate the method. Results match earlier ILS simulations. The contribution of the nonuniformity of light intensity across the detector surface is also taken into account.
机译:解释了一种用于获得傅立叶变换光谱仪的分析仪器线形(ILS)的简单有效的方法。计算了离轴圆形和矩形检测器的ILS,以说明该方法。结果与早期的ILS模拟相符。还应考虑到整个检测器表面的光强度不均匀性的影响。

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