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Measurement of the modal birefringence of single-mode K~(+) ion-exchanged planar waveguides with polarimetric interferometry

机译:偏振干涉法测量单模K〜(+)离子交换平面波导的模态双折射

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The polarimetric interference pattern on the surface of single-mode planar waveguides made by potassium ion exchange in soda-lime glass substrates can be observed through a 45° analyzer, which allows for the high-precision measurement of the modal birefringence of samples in a wide range of 0 to 5×10~(-4). Using this method, believed to be new, we investigated the effects of exchange temperature and time on the modal birefringence of single-mode potassium ion-exchanged waveguides. The modal birefringence profile was achieved by measurement of the variation of the phase difference between the TE_(0) and the TM_(0) modes with hydrofluoric-acid-etching depth of the sample.
机译:可以通过45°分析仪观察钠钙玻璃基板中通过钾离子交换在单模平面波导表面上产生的偏振干涉图样,从而可以在宽范围内高精度测量样品的模态双折射。范围为0到5×10〜(-4)。使用被认为是新方法的这种方法,我们研究了交换温度和时间对单模钾离子交换波导的模态双折射的影响。模态双折射曲线是通过测量TE_(0)和TM_(0)模式之间的相位差随样品的氢氟酸蚀刻深度而变化而获得的。

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