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Depolarization and principal Mueller matrix measured by null ellipsometry

机译：零偏光法测量去极化和主Mueller矩阵

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摘要

Methods for accurately measuring depolarization and principal Mueller matrix by null ellipsometry are devised. The measurement errors obtained with these methods are analyzed, and methods to correct for the errors are devised. The depolarization spectrum measured directly by null ellipsometry for a sapphire slab agrees excellently with the depolarization spectrum reduced indirectly from the retardance spectrum measured by rotating analyzer ellipsometry and the depolarization spectrum simulated for the retardance spread caused by a finite bandwidth of monochromator [J. Opt. Soc. Am. A 17, 2067 (2001)]. The measured cross-polarized depolarization for the sapphire slab is much smaller than the total depolarization.
机译：提出了通过零椭偏法精确测量去极化和主穆勒矩阵的方法。分析用这些方法获得的测量误差，并设计出校正误差的方法。用零偏椭圆法直接测量蓝宝石平板的去极化光谱与通过旋转分析仪椭圆偏光法测量的延迟光谱间接降低的去极化光谱以及模拟单色器有限带宽引起的延迟扩展模拟的去极化光谱非常吻合[J．选择。 Soc。上午。 A 17，2067（2001）]。测得的蓝宝石晶锭的交叉极化去极化比总的去极化小得多。

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