Relative measurements of second-order susceptibility with reflective second-harmonic generation

Costel Flueraru; Chander P. Grover

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Relative measurements of second-order susceptibility with reflective second-harmonic generation

机译：反射二次谐波产生对二阶磁化率的相对测量

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There is a strong demand for a simple and reliable technique for second-order susceptibility measurements of thin films. Since the Maker fringe technique is limited to transparent substrates we propose an experimental protocol based on reflective second-harmonic generation (SHG). The proposed protocol is based on relative measurements of Z-cut quartz. An analytical expression of the reflective SHG intensity dependence of the polarizer, analyzer, and sample azimuth is presented. An error analysis is also presented. Thin organic film of the side-chain polymer poly(Disperse Red 1 Methacrylate-Co-Methyl-Methacrylate) is investigated. Results for different wavelengths are reported.

机译：强烈需要一种简单可靠的技术来测量薄膜的二阶磁化率。由于Maker条纹技术仅限于透明基板，因此我们提出了基于反射二次谐波生成（SHG）的实验协议。提议的协议基于Z切石英的相对测量值。给出了偏振器，检偏器和样品方位角反射SHG强度依赖性的解析表达式。还提供了错误分析。研究了侧链聚合物聚（分散红1甲基丙烯酸酯-共-甲基丙烯酸甲酯）的有机薄膜。报告了不同波长的结果。

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《Applied optics》 |2003年第33期|共6页
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Costel Flueraru; Chander P. Grover;
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正文语种 eng
中图分类光学;
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1. Relative measurements of second-order susceptibility with reflective second-harmonic generation [J] . Costel Flueraru, Chander P. Grover Applied optics . 2003,第33期

机译：反射二次谐波产生对二阶磁化率的相对测量
2. Precise second-harmonic generation Maker fringe measurements in single crystals of the diacetylene NP/4-MPU and evaluation by a second-harmonic generation theory in 4X4 matrix formulation and ray tracing [J] . Braun M, Bauer F, Vogtmann T, Journal of the Optical Society of America, B. Optical Physics . 1997,第7期

机译：在二乙炔NP / 4-MPU单晶中进行精确的二次谐波生成Maker条纹测量，并通过二次谐波生成理论对4X4基质配方和射线跟踪进行评估
3. Measurement of orientation and susceptibility ratios using a polarization-resolved second-harmonic generation holographic microscope [J] . David G. Winters, David R. Smith, Philip Schlup, Biomedical Optics Express . 2012,第9期

机译：使用偏振分辨二次谐波全息照相显微镜测量取向和磁化率
4. Second-order susceptibility measurement of thin films by reflective second harmonic generation method - toward measurement standards in nonlinear optics [C] . C. Flueraru, C.P. Grover Applications of Photonic Technology: Closing the Gap between Theory, Development, and Application: 7A-Photonics North 2004: Optical Components and Devices pt.1 . 2004

机译：反射二次谐波产生法测量薄膜的二次磁化率-朝向非线性光学中的测量标准
5. Interactions of light and matter for tissue characterization via second-harmonic generation imaging microscopy and light scattering measurements. [D] . Hall, Gunnsteinn. 2012

机译：光和物质的相互作用，用于通过二次谐波成像显微镜和光散射测量来表征组织。
6. Measurement of orientation and susceptibility ratios using a polarization-resolved second-harmonic generation holographic microscope [O] . David G. Winters, David R. Smith, Philip Schlup, 2012

机译：使用偏振分辨二次谐波全息照相显微镜测量取向和磁化率
7. Enhancement of UV Second-Harmonic Radiation at Nonlinear Interfaces with Discontinuous Second-order Susceptibilities [O] . Zhao, Xiaohui, Zheng, Yuanlin, Ren, Huaijin, 2016

机译：用非线性接口增强非线性界面的紫外二次谐波辐射不连续的二阶敏感性

Relative measurements of second-order susceptibility with reflective second-harmonic generation

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