首页> 外文期刊>Applied optics >DIRECT X-RAY IMAGING SYSTEM USING AN AMPLIFIED METAL-OXIDE-SEMICONDUCTOR IMAGER IN THE 4-13-NM WAVELENGTH REGION
【24h】

DIRECT X-RAY IMAGING SYSTEM USING AN AMPLIFIED METAL-OXIDE-SEMICONDUCTOR IMAGER IN THE 4-13-NM WAVELENGTH REGION

机译:在4-13海里波长区域中使用放大的金属氧化物-半电子成像器成像的直接X射线成像系统

获取原文
获取原文并翻译 | 示例
           

摘要

We describe a direct x-ray imaging system that uses an amplified metal-oxide-semiconductor imager to detect soft x rays directly for real-time imaging. From the absolute sensitivity of this system as measured through the use of a monochromatic synchrotron radiation beam and a GaAsP Schottky-type photodiode, the minimum sensitivity at a wavelength of 13 nm was estimated to be greater than 10(8) photons mm(-2). This is sufficient to detect soft x rays directly for real-time imaging. Onion cell observations at wavelengths of 4.3 and 4.6 nm indicate that x-ray absorption by the carbon in the cells was detected. This is a promising imaging system for the soft x-ray region in which conventional CCD's are difficult to use. (C) 1995 Optical Society of America [References: 8]
机译:我们描述了一种直接X射线成像系统,该系统使用放大的金属氧化物半导体成像仪直接检测软X射线以进行实时成像。通过使用单色同步加速器辐射束和GaAsP肖特基型光电二极管测量的该系统的绝对灵敏度,估计在13 nm波长处的最小灵敏度大于10(8)个光子mm(-2 )。这足以直接检测软X射线以进行实时成像。洋葱细胞在4.3和4.6 nm波长处的观察表明,检测到了细胞中碳的X射线吸收。对于难以使用常规CCD的软X射线区域,这是一种很有前途的成像系统。 (C)1995年美国眼镜学会[参考文献:8]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号