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Method for Segregation of Suspected Logical Malfunctions in Combinatorial Discrete Devices

机译:组合离散设备中可疑逻辑故障的隔离方法

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摘要

Consideration was given to the direct problem of technical diagnosis which lies in determining the technical state of a combinatorial discrete device from the results of testing. The graph and analytical models of behavior of the combinatorial discrete device allowing for the technical state of its elements were presented. A method of segregation of the suspected logical malfunctions under which observable behavior of the combinatorial discrete device is possible was proposed.
机译:考虑了技术诊断的直接问题,即直接从测试结果确定组合式分立设备的技术状态。给出了考虑到其元件技术状态的组合式分立器件行为的图形和分析模型。提出了一种分离可疑逻辑故障的方法,在这种方法下组合离散设备的可观察行为是可能的。

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