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首页> 外文期刊>International journal of nanoscience >ADHESION BETWEEN AN AFM PROBE AND AN INCOMPRESSIBLE ELASTIC FILM
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ADHESION BETWEEN AN AFM PROBE AND AN INCOMPRESSIBLE ELASTIC FILM

机译：AFM探针和不可压缩的弹性膜之间的粘附

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摘要

The Johnson-Kendal-Roberts (JKR) adhesion theory is frequently applied to extract the surface energy of the contacting thin coating systems in micro or nanoprobe instruments such as Surface Force Apparatus (SFA) and Atomic Force Microscope (AFM). For thin-layer systems, the JKR theory may give rise to erroneous predictions as it is based on the elastic contact between a sphere and a half-space. Adhesion between the thin-layer surfaces has been analyzed by Sridhar et al. using a numerical SJF (Sridhar-Johnson-Fleck) model. In this paper, the adhesion between a spherical tip of an AFM and an incompressible thin elastic film is investigated. When the substrate is rigid, the normalised pull-off force may differ from the JKR value of -0.5 by as much as 90%. Computations of the contact size and pull-off force are presented for a range of values of adhesion energy. Finally, an empirical equation for the adhesive load was developed by curve fitting the compliance of the layer system as a function of contact radius.
机译：约翰逊·肯德尔·罗伯茨（JKR）粘附理论经常用于提取微型或纳米探针仪器（例如表面力仪器（SFA）和原子力显微镜（AFM））中接触的薄涂层系统的表面能。对于薄层系统，JKR理论可能会基于球体与半空间之间的弹性接触而产生错误的预测。 Sridhar等人分析了薄层表面之间的粘附力。使用数值SJF（Sridhar-Johnson-Fleck）模型。本文研究了原子力显微镜的球形尖端与不可压缩的弹性薄膜之间的粘附力。当基材是刚性的时，归一化的拉拔力可能与-0.5的JKR值相差多达90％。给出了一系列粘附能值的接触尺寸和拉脱力的计算。最后，通过曲线拟合层系统的柔度作为接触半径的函数，得出了粘合剂载荷的经验方程。

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