...
首页> 外文期刊>International journal of mass spectrometry >The importance of a correct dead time setting in isotope ratio mass spectrometry: Implementation of an electronically determined dead time to reduce measurement uncertainty
【24h】

The importance of a correct dead time setting in isotope ratio mass spectrometry: Implementation of an electronically determined dead time to reduce measurement uncertainty

机译:正确的死区时间设置在同位素比率质谱法中的重要性:实施电子确定的死区时间以减少测量不确定度

获取原文
获取原文并翻译 | 示例
           

摘要

Dead time determinations on a mass spectrometry system with ion counting detection can either be done using an isotope ratio measurement approach or via electronic examination of individual components, e.g., the pulse amplifier. Depending on the dead time of each component in the signal chain, the electronically determined result may not represent the true value for the total system, i.e., there might be a series of hardware related dead times. However, a hardware set artificial dead time in the pulse counting system that is long enough might yield a system dead time that can be represented by this set dead time solely. It is shown in this work that a carefully chosen, artificially introduced set dead time yields a system that may be characterized to a much lower uncertainty than is possible using ratio-based measurement approaches. Ultimately, the impact of the dead time on the combined uncertainty of an isotope abundance ratio measurement may be negligible even at very high count rates, i.e., >1 Mcps. In other words, incorporating the dead time contribution in a combined uncertainty calculation would no longer be necessary. (C) 2006 Elsevier B.V. All rights reserved.
机译:在具有离子计数检测功能的质谱系统上,死区时间的确定可以使用同位素比测量方法进行,也可以通过电子检查单个组件(例如脉冲放大器)来完成。取决于信号链中每个组件的死区时间,电子确定的结果可能无法代表整个系统的真实值,即可能存在一系列与硬件相关的死区时间。但是,在脉冲计数系统中由硬件设置的人工死区时间足够长,可能会产生只能由该设置的死区时间表示的系统死区时间。这项工作表明,精心选择的,人工引入的设定死区时间会产生一个系统,该系统的不确定性要比使用基于比率的测量方法低得多。最终,即使在非常高的计数率(即> 1 Mcps)下,停滞时间对同位素丰度比测量的综合不确定性的影响也可以忽略不计。换句话说,不再需要将空载时间贡献纳入组合的不确定性计算中。 (C)2006 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号