Rapid estimation of the height-height correlation functions from the synchrotron X-ray and AFM study of very thin SnO2/alpha-Al2O3(0001) film

Rue GH.; Sug JY.; Lee SH.; Ha SJ.; Lee KS.; Kim JG.; Yoo DH.; Hwang YH. Kim HK.

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Rapid estimation of the height-height correlation functions from the synchrotron X-ray and AFM study of very thin SnO2/alpha-Al2O3(0001) film

机译：通过同步加速器X射线和原子力显微镜研究非常薄的SnO2 / alpha-Al2O3（0001）膜可快速估算高度-高度相关函数

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For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value rootG(12)(0) approximate to 1.67 Angstrom implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity. [References: 9]

机译：对于外延生长在蓝宝石上的有缺陷的半导体SnO2薄膜，通过快速方法从x射线散射和原子力显微镜（AFM）评估高度-高度相关函数。较小的rootG（12）（0）约为1.67埃，表明这些接口之间的相关性很好。这与纵向漫散射强度中明确定义的振荡相一致。 [参考：9]

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《International Journal of Modern Physics, B. Condensed Matter Physics, Statistical Physics, Applied Physics》 |2003年第9期|共5页
作者
Rue GH.; Sug JY.; Lee SH.; Ha SJ.; Lee KS.; Kim JG.; Yoo DH.; Hwang YH. Kim HK.;
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正文语种 eng
中图分类物理学;
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Scattering;

机译：散射;

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1. Rapid estimation of the height-height correlation functions from the synchrotron X-ray and AFM study of very thin SnO2/alpha-Al2O3(0001) film [J] . Rue GH., Sug JY., Lee SH., International Journal of Modern Physics, B. Condensed Matter Physics, Statistical Physics, Applied Physics . 2003,第8a9期

机译：通过同步加速器X射线和原子力显微镜研究非常薄的SnO2 / alpha-Al2O3（0001）膜可快速估算高度-高度相关函数
2. X-RAY ABSORPTION STUDY ON NUCLEATION OF SnO2 THIN FILMS GROWN NUCLEATION OF SnO2 THIN FILMS GROWN [J] . Matthew Weimer, Bo Hu, Steven Kraft, American Chemical Society, Division of Fuel Chemistry, Preprints . 2013,第2期

机译：SnO2薄膜成长核的X射线吸收研究
3. 2D-IR correlation analysis of thin film water adsorbed on alpha-Al2O3(0001) [J] . Thomas AC, Richardson HH Journal of Molecular Structure . 2006,第1a3期

机译：吸附在α-Al2O3上的薄膜水的二维红外相关分析（0001）
4. Analysis of antimony doped SnO2 thin film by synchrotron grazing incidence X-Ray diffraction [C] . Yang-Yi Lin Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE . 2011

机译：同步辐射掠入射X射线衍射分析掺锑SnO2薄膜
5. Synchrotron X-ray Studies of Pristine, Intercalated, and Functionalized Epitaxial Graphene on Silicon Carbide(0001). [D] . Emery, Jonathan D. 2013

机译：碳化硅上原始，插层和功能化外延石墨烯的同步X射线研究（0001）。
6. Pair distribution functions of amorphous organic thin films from synchrotron X-ray scattering in transmission mode [O] . Chenyang Shi, Rattavut Teerakapibal, Lian Yu, 2017

机译：透射模式下同步加速器X射线散射对非晶有机薄膜的成对分布函数
7. Surface roughness and height-height correlations dependence on thickness of YBaCuO thin films [O] . Blank, David H.A., Bijlsma, M.E., Moerman, R., 1997

机译：YBaCuO薄膜的表面粗糙度和高度-高度相关性取决于厚度

Rapid estimation of the height-height correlation functions from the synchrotron X-ray and AFM study of very thin SnO2/alpha-Al2O3(0001) film

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