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首页> 外文期刊>International journal of PIXE >PARTICLE INDUCED X-RAY EMISSION STUDIES OF ANTI-DIABETIC MEDICINAL PLANTS
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PARTICLE INDUCED X-RAY EMISSION STUDIES OF ANTI-DIABETIC MEDICINAL PLANTS

机译:抗糖尿病药用植物的颗粒诱导X射线发射研究

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摘要

Selected number of anti-diabetic medicinal plant leaves has been characterized by accelerator based particle-induced X-ray emission (PIXE) technique. Validity of the technique was assured by analyzing certified plant reference materials (CRMs). A large number of trace elements like Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Rb, Sr and Pb are found to be present in these studied leaf samples with variable proportions. The concentrations of elements like K and Ca are quantified in percentage level whereas other elements are found to be in parts per million levels. Among the studied samples, the leaves of Methi are found to be containing maximum amount of trace elements.
机译:所选数量的抗糖尿病药用植物叶片已通过基于促进剂的颗粒诱导X射线发射(PIXE)技术进行了表征。通过分析经过认证的植物参考材料(CRM),可以确保该技术的有效性。在这些研究的叶片样品中,发现存在大量痕量元素,如Ti,V,Cr,Mn,Fe,Co,Ni,Cu,Zn,Rb,Sr和Pb,它们的含量不同。诸如K和Ca等元素的浓度以百分比水平进行定量,而其他元素的浓度则以百万分之几为单位。在所研究的样品中,发现Methi的叶子含有最大量的痕量元素。

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