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首页> 外文期刊>International journal of PIXE >CHARACTERIZATION OF OFFSET PRINTING INK TAGGED WITH RARE-EARTH TAGGANTS BY X-RAY EMISSION TECHNIQUES
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CHARACTERIZATION OF OFFSET PRINTING INK TAGGED WITH RARE-EARTH TAGGANTS BY X-RAY EMISSION TECHNIQUES

机译：用X射线发射技术表征带有稀土标记的胶印油墨。

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摘要

Proton Induced X-ray Emission (PIXE) and Energy Dispersive X-ray Fluorescence (EDXRF) techniques have been used for elemental characterization of offset printing ink tagged with rare-earth taggants. The offset printing ink was tagged with rare-earth (La, Pr, Nd, Sm, Eu and Gd) thenoyltrifluoroacetonate chelates at about 1000-ppm level for each element separately. Small aliquots (approximately 20 mg) of tagged inks were coated on paper supports in the form of small circles having diameter 10–15 mm each and then analyzed. In the case of PIXE, a proton beam of energy 4 MeV and in the case of EDXRF a radioisotope source of 241Am (100 mCi) was used to excite the samples. The PIXE analysis showed well-resolved rare-earth L X-rays and EDXRF analysis showed the K X-rays of rare earths. Satisfactory results to identify and quantify the taggants were achieved.
机译：质子诱导的X射线发射（PIXE）和能量色散X射线荧光（EDXRF）技术已用于对用稀土标记剂标记的胶印油墨进行元素表征。胶印油墨分别用稀土元素（La，Pr，Nd，Sm，Eu和Gd）的壬基三氟丙酮酸酯螯合物标记，每种元素的含量约为1000ppm。将小等分的标记墨水（约20 mg）以每个直径10–15 mm的小圆圈的形式涂布在纸支架上，然后进行分析。在PIXE的情况下，能量为4 MeV的质子束，在EDXRF的情况下，使用241Am（100 mCi）的放射性同位素源激发样品。 PIXE分析显示了分辨良好的稀土L X射线，EDXRF分析显示了稀土的K X射线。识别和定量标记剂的结果令人满意。

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