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首页> 外文期刊>International Journal of Robotics & Automation >AUTOMATIC INSPECTION FOR ETCHING TRANSISTORS IN TFT-LCD PANEL USING BINARY TREE STRUCTURE AND BINTREE SEARCHING AND GRADIENT ORIENTATION CODE
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AUTOMATIC INSPECTION FOR ETCHING TRANSISTORS IN TFT-LCD PANEL USING BINARY TREE STRUCTURE AND BINTREE SEARCHING AND GRADIENT ORIENTATION CODE

机译：利用二叉树结构和双树搜索和梯度方向代码对TFT-LCD面板中的晶体管进行自动检查

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摘要

This paper proposes automatic online inspection and measurements for etching transistors in thin-film transistor liquid crystal display (TFT-LCD) panels. A new method of pattern recognition technology is used to track the target pattern image of TFT etching transistors, to match with the system database, to judge the kind of target etching transistor, and to locate the central position of etching transistors. Furthermore, the control massage is delivered to the servomechanism to normalize the inspection processes and to deal with the measurements for line width and distance. In the process of pattern searching, analysing, and recognizing, due to the characteristics of huge calculations on pattern matching, it is necessary to greatly reduce the time and to find out the correct target pattern image with binary tree structure and binary-tree searching and 16 gradient orientation code algorithms. Template matching method is a simple and powerful tool for pattern recognition and searching. This study also describes the improvement in template matching to greatly reduce matching time without sacrificing accuracy Additionally, this process could check several items at the same time such as, bias in the centre of illumination, uneven illumination distribution and multiple target detection. After transformation by the gradient orientation code, it can steadily conduct the tracking recognition and positioning of target pattern The innovation research combines binary-tree searching method and 16 gradient orientation code estimation is more precise. The proposed method can be used for inspecting the defect of LCD glass plates, and the thin film quality can be quickly obtained through automation.
机译：本文提出了用于薄膜晶体管液晶显示（TFT-LCD）面板中蚀刻晶体管的自动在线检查和测量方法。一种新型的模式识别技术，用于跟踪TFT蚀刻晶体管的目标图案图像，与系统数据库匹配，判断目标蚀刻晶体管的种类，并确定蚀刻晶体管的中心位置。此外，控制信息被传送到伺服机构以使检查过程正常化并处理线宽和距离的测量。在模式搜索，分析和识别的过程中，由于模式匹配的计算量大的特点，有必要大大减少时间，并通过二叉树结构和二叉树搜索来找到正确的目标模式图像。 16种梯度定向代码算法。模板匹配方法是一种简单而强大的模式识别和搜索工具。这项研究还描述了模板匹配的改进，可以在不牺牲准确性的情况下大大减少匹配时间。此外，该过程可以同时检查多个项目，例如照明中心的偏差，照明分布不均和多目标检测。通过梯度定向码进行变换后，可以稳定地进行目标图案的跟踪识别和定位。创新研究结合二叉树搜索法和16种梯度定向码估计更加精确。该方法可用于LCD玻璃板缺陷的检测，可通过自动化快速获得薄膜质量。

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