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首页> 外文期刊>International Journal of Solids and Structures >Boundary element modeling for defect characterization potential in a wave guide
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Boundary element modeling for defect characterization potential in a wave guide

机译：波导中缺陷表征潜力的边界元建模

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Wave scattering analysis implemented by boundary element methods (BEM) and the normal mode expansion technique is used to study the sizing potential of two-dimensional shaped defects in a wave guide. Surface breaking half-elliptical shaped defects of three opening lengths (0.3, 6.35 and 12.7 mm) and through-wall depths of 10-90% on a 10 mm thick steel plate were considered. The reflection and transmission coefficients of both Lamb and shear horizontal (SH) waves over a frequency range 0.05-2 MHz were studied. A powerfully practical result was obtained whereby the numerical results for the S-0 mode Lamb wave and n(0) mode SH wave at low frequencies showed a monotonic increase in signal amplitude with an increase in the defect through-wall depth. At high frequency (usually above the cut-off frequency of the A, mode for Lamb waves and the n(1) mode for SH waves, respectively), the monotonic trend does not hold in general due to the energy redistribution to the higher order wave modes. Guided waves impinging onto an internal stringer-like an inclusion were also studied. Both the Lamb and SH waves were shown to be insensitive to the stringer internal inclusions at low frequency. Experiments with piezoelectric Lamb wave transducers and non-contact SH wave electro-magnetic acoustic transducers (EMAT) verified some of the theoretical results. (C) 2003 Elsevier Science Ltd. All rights reserved. [References: 27]
机译：通过边界元方法（BEM）和法向模式扩展技术实现的波散射分析被用于研究波导中二维形状缺陷的尺寸确定潜力。考虑了在10毫米厚的钢板上具有三个开口长度（0.3、6.35和12.7毫米）和通孔深度为10-90％的表面断裂半椭圆形缺陷。研究了Lamb和水平横波（SH）在0.05-2 MHz频率范围内的反射和透射系数。获得了有力的实际结果，在低频情况下，S-0模式兰姆波和n（0）模式SH波的数值结果显示信号幅度单调增加，而缺陷通孔深度增加。在高频下（通常分别高于Lamb波的A截止频率和SH波的n（1）截止频率），由于能量向更高阶的重新分配，一般不会保持单调趋势波浪模式。还研究了撞击到内部纵梁状夹杂物上的导波。兰姆波和SH波都显示出对低频下的纵梁内部夹杂物不敏感。压电兰姆波换能器和非接触式SH波电磁声换能器（EMAT）的实验验证了一些理论结果。 （C）2003 Elsevier ScienceLtd。保留所有权利。 [参考：27]

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