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首页> 外文期刊>Electrochemical and solid-state letters >Ultrasmooth GaN Etched Surfaces Using Photoelectrochemical Wet Etching and an Ultrasonic Treatment
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Ultrasmooth GaN Etched Surfaces Using Photoelectrochemical Wet Etching and an Ultrasonic Treatment

机译:使用光电化学湿法刻蚀和超声处理的超光滑GaN刻蚀表面

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摘要

We have studied the effect of ultrasonic agitation on the surface of n-type gallium nitride (GaN) layers grown on sapphire that were subjected to a selective photoelectrochemical etch. Solutions of various concentrations of KOH were used along with an ultraviolet lamp to oxidize the exposed GaN surface, resulting in an anisotropic etch. Smooth surfaces with root-mean-square (rms) roughness of ~ 4 nm were obtained for a narrow range of etching conditions. It was found that this window could be extended by using etch conditions which produced "whisker" growth. Subsequent ultrasonic agitation was then used to remove these whiskers and obtain smoother surfaces with the best rms roughness values being ~ 0.9 nm.
机译:我们已经研究了超声搅拌对蓝宝石上生长的n型氮化镓(GaN)层表面的影响,该层经过了选择性光电化学蚀刻。将各种浓度的KOH溶液与紫外线灯一起使用,以氧化暴露的GaN表面,从而进行各向异性蚀刻。在狭窄的蚀刻条件范围内,可获得均方根(rms)粗糙度约为4 nm的光滑表面。已经发现,可以通过使用产生“晶须”生长的蚀刻条件来扩展该窗口。然后,随后的超声搅拌用于去除这些晶须,并获得平滑的表面,其最佳均方根粗糙度值为〜0.9 nm。

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