Film thickness measuring unit with two displays

European Coatings Journal Group

首页> 外文期刊>European Coatings Journal >Film thickness measuring unit with two displays

【24h】

Film thickness measuring unit with two displays

机译：带两个显示屏的膜厚测量仪

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

To give greater flexibility when measuring film thickness,Helmut Fischer has developed the hand-held unit"Dualscope MPOR".This is equipped with two displays,enabling the user to read off the measurement data from almost any measuring position.The universal prode makes measurement times short and measures films up to 2 mm thick on both steel and non-feerous metals.

机译：为了在测量薄膜厚度时提供更大的灵活性，Helmut Fischer开发了手持式设备“ Dualscope MPOR”。该设备配有两个显示屏，使用户能够从几乎任何测量位置读取测量数据。通用探头进行测量在金属和非铁金属上测量短至2毫米厚的薄膜并测量厚度最大为2毫米的薄膜。

著录项

来源
《European Coatings Journal》 |2003年第12期|共1页
作者
European Coatings Journal Group;
展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类涂料工业;
关键词

相似文献

外文文献
中文文献
专利

1. Film thickness measuring unit with two displays [J] . European Coatings Journal Group European Coatings Journal . 2003,第12期

机译：带两个显示屏的膜厚测量仪
2. Measuring the thickness and thickness uniformity of ultra-thin AlO{sub}x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy [J] . E. Z. Luo, S. K. Wong, A. B. Pakhomov, 電子情報通信学会技術研究報告. 磁気記録. Magnetic Recording . 2001,第400期

机译：结合RBS和原子力显微镜测量磁性隧道结中超薄AlO {sub} x薄膜的厚度和厚度均匀性
3. Measuring the thickness and thickness uniformity of ultra-thin AlO{sub}x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy [J] . E. Z. Luo, S. K. Wong, A. B. Pakhomov, 電子情報通信学会技術研究報告. 磁気記録. Magnetic Recording . 2001,第400期

机译：通过组合RBS和导电原子力显微镜测量超薄ALO {SUB} X膜在磁隧道连接中的厚度和厚度均匀性
4. Barix encapsulation for OLED displays, a thin film solution for reducing thickness and cost [C] . L.L. Moro, N.M. Rutherford, X. Chu, International Display Manufacturing Conference FPD Expo(IDMC'03) . 2003

机译：用于OLED显示器的Barix封装，一种用于降低厚度和成本的薄膜解决方案
5. THREE-BEAM SHEARING INTERFEROMETER FOR MEASURING THIN FILM THICKNESS, SURFACE ROUGHNESS, AND SURFACE FIGURE. [D] . ALMARZOUK, KAIS. 1982

机译：用于测量薄膜厚度，表面粗糙度和表面图形的三束剪切干涉仪。
6. The electron as a probe to measure the thickness distributions of electroactive films [O] . Darren Buesen, Huaiguang Li, Nicolas Plumeré 2020

机译：电子作为测量电活性膜的厚度分布的探针
7. Measuring Thickness and Pretilt in Reflective Vertically Aligned Nematic Liquid Crystal Displays [O] . B. Cerrolaza, M. A. Geday, J. M. Oton, 2015

机译：测量反射垂直排列向列型液晶显示器的厚度和预倾角

Film thickness measuring unit with two displays

摘要

著录项

相似文献

相关主题

期刊订阅