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首页> 外文期刊>European Journal of Glass Science and Technology, PartB. Physics and Chemistry of Glasses >Spin coated chalcogenide films of Ge-Se-Te: physico-chemical properties
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Spin coated chalcogenide films of Ge-Se-Te: physico-chemical properties

机译：Ge-Se-Te旋涂硫族化物薄膜：物理化学性质

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摘要

This article describes the preparation and characterisation of spin coated Ge_(20)Se_(80-x)Te_x chalcogenide films, where x=0; 2.5; 5; 7.5 and 10 at percent. The films have been prepared by a standard spin coating technique from n-butylamine solution, and were stabilised by annealling in a vacuum furnace at elevated temperatures and reduced pressures. The chemical composition of the spin coated films has been established by energy dispersive x-ray analysis. Measurements of the chemical and physical properties have been carried out using techniques such as variable angle spectroscopic ellipsometry, and by optical transparence measurements to characterise the optical properties of films. Raman spectroscopy was used to determine the film's structure and nuclear magnetic resonance spectroscopy to verify the dissolution process in amines.
机译：本文介绍了旋涂Ge_（20）Se_（80-x）Te_x硫族化物薄膜的制备和表征，其中x = 0; 2.5; 5; 7.5和10 at％。膜是通过标准旋涂技术由正丁胺溶液制得的，并通过在真空炉中在高温和减压下退火来稳定化。旋涂膜的化学组成已通过能量色散X射线分析确定。化学和物理性质的测量已经使用诸如可变角光谱椭圆仪的技术进行，并且通过光学透明性测量来表征膜的光学性质。拉曼光谱法用于确定薄膜的结构，核磁共振光谱法用于验证胺的溶解过程。

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