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首页> 外文期刊>Flow Measurement and Instrumentation >Testing the Wafer V-Cone flowmeters in accordance with API 5.7 'Testing Protocol for Differential Pressure Flow Measurement Devices' in the CEESI Colorado test facility
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Testing the Wafer V-Cone flowmeters in accordance with API 5.7 'Testing Protocol for Differential Pressure Flow Measurement Devices' in the CEESI Colorado test facility

机译：根据CEESI Colorado测试设施中的API 5.7“差压流量测量设备测试协议”测试Wafer V型锥流量计

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The paper describes the testing of the Wafer V-Cone meters in accordance with the new API 5.7 "Testing Protocol for Differential Pressure Flow Measurement Devices" in the Colorado test facility. The use of this new API standard and some of the points which had to be addressed in order to implement the standard are discussed. The results of the testing of 2" and 4" Wafer V-Cone meters in water and in gas are given. The non-standard testing requirements in the standard will provide evidence of the conditioning effect of the V-Cone as it meters the fluid. The conclusions reached were: API 5.7 tests the claims of the meter manufacturer regarding the product in a demanding manner. As the procedure is implemented the need to make amendments will become apparent and this paper will address some of the limitations which became evident while testing. The results of the Wafer V-Cone testing uncertainty will be discussed.
机译：本文介绍了在科罗拉多州测试设施中根据新API 5.7“压差流量测量设备测试协议”对Wafer V型锥表进行的测试。讨论了该新API标准的使用以及实现该标准必须解决的一些问题。给出了在水和气体中2“和4” Wafer V-Cone流量计的测试结果。标准中的非标准测试要求将为V型锥计量液体时的调节效果提供证据。得出的结论是：API 5.7以苛刻的方式测试了电表制造商对产品的索赔。随着该程序的实施，需要进行修改的需求将变得显而易见，并且本文将介绍一些在测试中显而易见的局限性。将讨论Wafer V-Cone测试不确定性的结果。

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