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首页> 外文期刊>Fruit, Vegetable and Cereal Science and Biotechnology >Effects of Septoria Leaf Blotch Infection on Grain Yield and its Components of Three Bread Wheat Genotypes (Triticum aestivum L.)
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Effects of Septoria Leaf Blotch Infection on Grain Yield and its Components of Three Bread Wheat Genotypes (Triticum aestivum L.)

机译：葡萄球菌斑块感染对三种小麦基因型小麦籽粒产量及其组成的影响

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摘要

Septoria tritici (perfect stage, Mycosphaerella graminicola) is widely spread all over the world and generates serious crop losses in many wheat-growing regions. This study was carried out in situ to determine the effects of infection by S. tritici ongrain yield (GY) and its components of three bread wheat (Triticum aestivum L.) genotypes (Tanit, Tirant and Serir_2). Two treatments were applied. The first one was a control plot treated with a fungicide (Dithane M45) and the second was an artificially infected plot. The development of infection was evaluated by IL and IP, AUDPC and R. Agronomic parameters were used to study the reaction variability of the studied genotypes and to determine the impact of the infection on GY and its components. Results showed that climatic conditions were favourable to the development of infection and that the tested bread wheat genotypes were sensitive to 51 tritici. 1000-grain weight was the most negatively affected GY component. On the other hand, IL and IP partlyexplain the loss in 1000-grain weight. On the protected plots, the positive action of the fungicide enhanced plant tolerance and generated a synergy expressed by the improvement of GY and its components.
机译：小麦黑粉病（完美的阶段，Mycosphaerella graminicola）在世界各地广泛传播，并在许多小麦种植地区造成严重的农作物损失。这项研究是就地进行的，以确定三种小麦面包基因（Tanit，Tirant和Serir_2）对小麦和黑麦草产量（GY）及其成分的感染作用。进行了两种处理。第一个是用杀菌剂（Dithane M45）处理过的对照样地，第二个是人工感染的样地。通过IL和IP，AUDPC和R评估感染的发展。农艺学参数用于研究所研究基因型的反应变异性，并确定感染对GY及其成分的影响。结果表明，气候条件有利于感染的发生，所测试的面包小麦基因型对51个小麦品种敏感。影响最大的GY成分是1000粒重。另一方面，IL和IP部分解释了1000粒重的损失。在保护地上，杀菌剂的积极作用增强了植物的耐受性，并通过改善甘草油及其成分而产生了协同作用。

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