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Monte carlo uncertainty analysis for photothermal radiometry measurements using a curve fit process

机译:使用曲线拟合过程进行光热辐射测量的蒙特卡洛不确定性分析

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摘要

Photothermal radiometry (PTR) has become a popular method to measure thermal properties of layered materials. Much research has been done to determine the capabilities of PTR, but with little uncertainty analysis. This study reports a Monte Carlo uncertainty analysis to quantify uncertainty of film diffusivity and effusivity measurements, presents a sensitivity study for each input parameter, compares linear and logarithmic spacing of data points on frequency scans, and investigates the validity of a one-dimensional heat transfer assumption. Logarithmic spacing of frequencies when taking data is found to be unequivocally superior to linear spacing, while the use of a higher-dimensional heat transfer model is only needed for certain measurement configurations. The sensitivity analysis supports the frequency spacing conclusion, as well as explains trends seen in the uncertainty data.
机译:光热辐射法(PTR)已成为一种测量层状材料热性能的流行方法。已经进行了很多研究来确定PTR的功能,但是很少进行不确定性分析。这项研究报告了蒙特卡洛不确定性分析,以量化膜扩散性和发射率测量的不确定性,提出了针对每个输入参数的敏感性研究,比较了频率扫描中数据点的线性和对数间距,并研究了一维热传递的有效性假设。发现在获取数据时,频率的对数间隔无疑比线性间隔更好,而仅对于某些测量配置,才需要使用更高维的热传递模型。灵敏度分析支持频率间隔结论,并解释不确定性数据中的趋势。

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