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首页> 外文期刊>Microwave and optical technology letters >ONE-DIMENSIONAL RECONSTRUCTION OF A DEFECT PROFILE BASED ON MILLIMETER-WAVE NONDESTRUCTIVE TECHNIQUES
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ONE-DIMENSIONAL RECONSTRUCTION OF A DEFECT PROFILE BASED ON MILLIMETER-WAVE NONDESTRUCTIVE TECHNIQUES

机译:基于毫米波无损检测技术的缺陷轮廓的一维重建

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摘要

This paper describes a procedure for the characterization of defects inside dielectric materials. This nondestructive technique is supported by the development of a system that operates at 35 GHz The reconstruction of the defect profile is performed by considering that the measured data are the result of a convolution of the true data with a point-spread function (PSF).
机译:本文介绍了介电材料内部缺陷的表征程序。通过在35 GHz下运行的系统的开发来支持这种无损技术。通过考虑测量数据是真实数据与点扩展函数(PSF)卷积的结果来执行缺陷轮廓的重建。

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