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机译:
Atom Energy Commiss, Dept Phys, Damascus 6091, Syria;
Thin films; Zinc oxide; Structure properties; Z-scan; Morphology;
机译:Assessment of the third order nonlinear optical susceptibility of V2−xCoxO5 (x = 0.0, 0.05, 0.10, 0.20) thin film via Z-scan technique
机译:Investigation on Third-Order Nonlinear Optical Properties of Four Transition Metal Complexes Thin Films by Z-Scan Technique
机译:Nonlinear Optical Response of Hydroxy Substituted Anthraquinone/PMMA Thin Films Using Z-Scan Technique
机译:all-optical continuous-tunable image switch based on nonlinear photoinduced anisotropy in bacteriorhodopsin film
机译:studies of ferroelectric heterostructure thin films and interfaces via in situ211 analytical techniques