...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Measurement Science & Technology >Quantitative assessment of slit Mura defect in a thin film transistor-liquid crystal display based on chromaticity and optical density
【24h】

Quantitative assessment of slit Mura defect in a thin film transistor-liquid crystal display based on chromaticity and optical density

机译：基于色度和光密度的薄膜晶体管液晶显示器中狭缝Mura缺陷的定量评估

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

An innovative non-contact optical inspection method is developed to quantify slit Mura defects for thin film transistor-liquid crystal displays (TFT-LCDs). From the measurements of both chromaticity and optical densities across the slit Mura, the results indicate that the optical density profile is a concave shape and the chromaticity distribution is a convex shape. A linear relation with a negative slope exists between the chromaticity and optical density. A larger colour difference has a steeper slope, and vice versa. All of the measurements with uncertainties of a 99.7percent confidence interval satisfy the requirements of the flat panel display industry. The proposed method can accurately quantify the pattern of blue slit Mura of TFT-LCDs; even the perceptibility is below the just noticeable difference.
机译：开发了一种创新的非接触式光学检查方法，以量化薄膜晶体管-液晶显示器（TFT-LCD）的狭缝Mura缺陷。从横跨狭缝Mura的色度和光密度的测量结果表明，光密度分布为凹形，色度分布为凸形。在色度和光密度之间存在负斜率的线性关系。较大的色差具有较陡的斜率，反之亦然。不确定性在99.7％的置信区间内的所有测量均满足平板显示器行业的要求。该方法可以准确地量化TFT-LCD的蓝缝Mura的图案。即使可感知性也低于恰到好处的差异。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号