...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Measurement Science & Technology >Testing of x-ray microtomography systems using a traceable geometrical standard
【24h】

Testing of x-ray microtomography systems using a traceable geometrical standard

机译：使用可追溯的几何标准测试X射线显微断层摄影系统

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

X-ray computed microtomography is an interesting imaging technique for many applications, and is also very promising in the field of coordinate metrology at the micro scale. The main advantage with respect to traditional tactile-probing or optical coordinate measurement systems is that x-ray tomography can acquire dimensional and geometrical data for both inner and outer surfaces, without accessibility restrictions. However, there are no accepted test procedures available so far and measurement uncertainty is unknown in many cases, due to complex and numerous error sources. The paper presents the first results of a test procedure implemented for determining the errors of indication for length measurements of x-ray microtomography systems, using a new reference standard featuring a regular array of inner and outer cylindrical shapes. The developed test method allows the determination of specific characteristics of x-ray microtomography systems and can be used for the correction of systematic errors.
机译：X射线计算机显微断层摄影术是许多应用中令人感兴趣的成像技术，并且在微观尺度的坐标计量学领域也非常有前途。关于传统的触觉探测或光学坐标测量系统的主要优点是，X射线断层扫描可以获取内表面和外表面的尺寸和几何数据，而没有可访问性限制。但是，到目前为止，尚无公认的测试程序可用，并且由于复杂而众多的误差源，在许多情况下测量不确定性是未知的。本文介绍了一种测试程序的最初结果，该程序使用一种新的参考标准来确定X射线显微断层照相系统长度测量的指示误差，该参考标准具有规则的内部和外部圆柱形状阵列。开发的测试方法可以确定X射线断层摄影系统的特定特性，并可用于系统误差的校正。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号