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首页> 外文期刊>Review of Scientific Instruments >A microcontroller-based failsafe for single photon counting modules
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A microcontroller-based failsafe for single photon counting modules

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摘要

Avalanche photodiode-based single photon counting modules (SPCMs) can be damaged by exposure to excessive light levels. A flexible and inexpensive failsafe is presented which has been shown to protect SPCMs from light levels far exceeding the damage threshold.

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