Individual multiwall carbon nanotubes spectroscopy by scanning transmission X-ray microscopy

Felten A; Bittencourt C; Pireaux JJ; Reichelt M; Mayer J; Hernandez-Cruz D; Hitchcock AP

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Individual multiwall carbon nanotubes spectroscopy by scanning transmission X-ray microscopy

机译：通过扫描透射X射线显微镜观察单个多壁碳纳米管光谱

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Scanning transmission X-ray microscopy (STXM) has been used to probe the electronic structure of individual multiwall carbon nanotubes by chemical mapping at the nanoscale. Carbon 1s near-edge X-ray absorption fine structure (NEXAFS) spectra of individual structures are shown to be able to differentiate carbon nanotubes from onionlike carbon nanoparticles and to differentiate nanotubes synthesized by different growth methods. Imaging of the very same region by both STXM and transmission electron microscopy is shown to be a very useful and complementary approach.

机译：扫描透射X射线显微镜（STXM）已经用于通过纳米级的化学作图来探测单个多壁碳纳米管的电子结构。单个结构的碳1s近边缘X射线吸收精细结构（NEXAFS）光谱显示能够区分碳纳米管与洋葱状碳纳米颗粒，并能够区分通过不同生长方法合成的纳米管。通过STXM和透射电子显微镜对同一区域的成像显示是一种非常有用且互补的方法。

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来源
《Nano letters》 |2007年第8期|共6页
作者
Felten A; Bittencourt C; Pireaux JJ; Reichelt M; Mayer J; Hernandez-Cruz D; Hitchcock AP;
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正文语种 eng
中图分类特种结构材料;
关键词
ADVANCED LIGHT-SOURCE; ABSORPTION FINE-STRUCTURE; ELECTRON-ENERGY-LOSS; PHOTOELECTRON MICROSCOPY; MICROBIAL BIOFILMS; RESOLUTION; RADIATION; BEAMLINE; NEXAFS; TIPS;

机译：先进光源;吸收精细结构;电子能量损失;光电子显微镜;微生物生物膜;分辨率;辐射;束线;NEXAFS;技巧;

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1. Individual multiwall carbon nanotubes spectroscopy by scanning transmission X-ray microscopy [J] . Felten A, Bittencourt C, Pireaux JJ, Nano letters . 2007,第8期

机译：通过扫描透射X射线显微镜观察单个多壁碳纳米管光谱
2. Measuring inside damage of individual multi-walled carbon nanotubes using scanning transmission X-ray microscopy [J] . Liu Jinyin, Bai Lili, Wang Jian, Applied Physics Letters . 2014,第24期

机译：使用扫描透射X射线显微镜测量单个多壁碳纳米管的内部损伤
3. Measuring inside damage of individual multi-walled carbon nanotubes using scanning transmission X-ray microscopy [J] . Jinyin Liu, Lili Bai, Jian Wang, Applied Physics Letters . 2014,第24期

机译：使用扫描透射X射线显微镜测量单个多壁碳纳米管的内部损伤
4. Combination of scanning probe microscopy techniques for evaluating the electrical parameters of individual multiwalled carbon nanotubes [C] . D V Sokolov, N A Davletkildeev, V V Bolotov International Conference on Scanning Probe Microscopy . 2017

机译：用于评估各个多壁碳纳米管电气参数的扫描探针显微镜技术的组合
5. Characterization of individual aquatic suspended particles using electron probe x-ray micro-analysis and scanning transmission electron microscopy. [D] . Jambers, Wendy. 1997

机译：使用电子探针X射线显微分析和扫描透射电子显微镜对单个水悬浮颗粒进行表征。
6. Revealing the Role of Catalysts in Carbon Nanotubes and Nanofibers by Scanning Transmission X-ray Microscopy [O] . Jing Gao, Jun Zhong, Lili Bai, -1

机译：通过扫描透射X射线显微镜揭示催化剂在碳纳米管和纳米纤维中的作用
7. Revealing the Role of Catalysts in Carbon Nanotubes and Nanofibers by Scanning Transmission X-ray Microscopy [O] . Jing Gao, Jun Zhong, Lili Bai, 2014

机译：通过扫描透射X射线显微镜揭示催化剂在碳纳米管和纳米纤维中的作用

Individual multiwall carbon nanotubes spectroscopy by scanning transmission X-ray microscopy

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