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Defect studies of ZnSe nanowires

机译:ZnSe纳米线的缺陷研究

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During the synthesis of ZnSe nanowires various point and extended defects can form, leading to observed stacking faults and twinning defects, and strong defect related emission in photoluminescence spectra. In this paper, we report on the development of a simple thermodynamic model for estimating the defect concentration in ZnSe nanowires grown under varying Se vapour pressure and for explaining the results of our experimental findings. Positron annihilation spectroscopy was used successfully for the first time for nanowires and the results support predictions from the defect model as well as agreeing well with our structural and optical characterization results. Under very high Se vapour pressure, Se nodules were observed to form on the sidewalls of the nanowire, indicating that beyond a limit, excess Se will begin to precipitate out of the liquid alloy droplet in the vapour-liquid-solid growth of nanowires.
机译:在ZnSe纳米线的合成过程中,会形成各种点缺陷和扩展缺陷,从而导致观察到的堆垛层错和孪生缺陷,以及光致发光光谱中与缺陷有关的强发射。在本文中,我们报告了一个简单的热力学模型的发展,该模型用于估算在变化的Se蒸气压下生长的ZnSe纳米线中的缺陷浓度,并解释我们的实验结果。正电子ni没光谱法首次成功用于纳米线,其结果支持了缺陷模型的预测,并与我们的结构和光学表征结果非常吻合。在非常高的Se蒸气压下,观察到在纳米线的侧壁上会形成Se结节,这表明超过极限时,过量的Se将开始从纳米线的气液固生长中的液态合金滴中沉淀出来。

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