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Deep UV pattern definition in PMMA

机译:PMMA中的深紫外线图案定义

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We have patterned polymethyl methacrylate (PMMA) resist by exposing it to the fifth harmonic (213 nm) of an Nd:YAG source through metalized apertures in contact with the resist. Interference patterns with both near- and far-field origins were observed. In order to test the contrast and uniformity of exposure, we deposited germanium onto developed areas to form arrays with feature sizes of similar to 200 nm. We present a straightforward model for interference effects generated in our process, and discuss opportunities for direct-write lithography through single apertures.
机译:我们通过将聚甲基丙烯酸甲酯(PMMA)抗蚀剂通过与抗蚀剂接触的金属化开口暴露在Nd:YAG源的五次谐波(213 nm)上,从而对其进行了图案化。观察到具有近场和远场起源的干扰模式。为了测试曝光的对比度和均匀性,我们将锗沉积到显影区域上,以形成特征尺寸类似于200 nm的阵列。我们提出了一个简单的模型来处理过程中产生的干涉效应,并讨论了通过单孔进行直接写入光刻的机会。

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