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Water contact angles of vertically aligned Si nanorod arrays

机译:垂直排列的硅纳米棒阵列的水接触角

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摘要

The equilibrium water contact angles of vertically aligned nanorod Si films were measured by the sessile drop method. For as-deposited hydrophilic films, there was a contact angle transition from a rough surface to a 'hemi-wicking' porous surface at normal film thickness d = 500 nm; while for the HF treated hydrophobic films, a transition from a partially composite to a composite surface was observed at the same film thickness. The observed results can be reasonably interpreted within the framework of the classical Young theory.
机译:垂直取向的纳米棒硅膜的平衡水接触角通过无滴法测量。对于沉积的亲水膜,在正常膜厚d = 500 nm时,接触角从粗糙表面过渡到“半芯吸”多孔表面。而对于HF处理的疏水膜,在相同的膜厚度下观察到了从部分复合材料到复合材料表面的过渡。可以在经典杨理论的框架内合理地解释观察到的结果。

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