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Nano-rubbing of a liquid crystal alignment layer by an atomic force microscope: a detailed characterization

机译:原子力显微镜对液晶取向层的纳米摩擦:详细表征

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Locally rubbing the surface of a polymer using the stylus of an atomic force microscope (AFM nano-rubbing) has recently found extensive applications in prototyping novel micro- and nano-structured liquid crystal (LC) electro-optic devices. We report here on the detailed characteristics of the AFM nano-rubbed polyimide in terms of the friction force and the LC alignment capability. A unidirectionally rubbed polyimide by the contact mode AFM showed anisotropic friction, along and against the rubbing direction, even at a rubbing load as small as 1 nN and yielded a finite pretilt angle reflecting the asymmetry. Rubbing at high loads generated conspicuous scratches on the polyi8mide surface; when annealed at temperatures well below the glass transition or soaked into an organic solvent, however, these scratches quickly relaxed and completely disappeared while maintaining the capability of aligning LCs. When the load was small, the LC alignment also disappeared altogether. These experimental observations suggest that although the top thin layer might be sufficient to initially orient LCs, persistent surface alignment entails deeper cultivation of anisotropic structures.
机译:最近,使用原子力显微镜的测针(AFM纳米摩擦)对聚合物的表面进行局部摩擦,已在新型微结构和纳米结构液晶(LC)电光器件的原型设计中获得了广泛的应用。我们在这里报告了AFM纳米摩擦聚酰亚胺在摩擦力和LC对准能力方面的详细特征。即使在小至1 nN的摩擦载荷下,通过接触模式AFM进行的单向摩擦聚酰亚胺也沿摩擦方向和逆摩擦方向显示出各向异性摩擦,并且产生了反映不对称性的有限预倾角。高负荷摩擦会在聚酰亚胺表面上产生明显的划痕;但是,当在远低于玻璃化转变温度的温度下退火或浸入有机溶剂中时,这些划痕会迅速放松并完全消失,同时保持对齐LC的能力。当负载较小时,LC对齐也完全消失。这些实验观察结果表明,尽管顶层薄层可能足以使LC最初定向,但持久的表面对齐需要对各向异性结构进行更深的培养。

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