Probing electrical transport in nanowires: current maps of individual V_2O_5 nanofibres with scanning force microscopy

C Gomez-Navarro; P J de Pablo; J Colchero

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Probing electrical transport in nanowires: current maps of individual V_2O_5 nanofibres with scanning force microscopy

机译：探测纳米线中的电传输：带有扫描力显微镜的单个V_2O_5纳米纤维的电流图

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In this work we present two scanning force microscopy (SFM) techniques applied to the electrical characterization of V_2O_5 nanofibres with one end connected to a metallic electrode: first a non-contact imaging technique combined with the acquisition of current versus voltage curves in a selected spot, and second jumping mode SFM that allows simultaneous acquisition of topograhic images and current maps with nanometric resolution. Both the conductivity (approx 20 S cm~(-1)) and the contact resistance (approx 62 M OMEGA) of the fibres are determined. A non-linear behaviour of the conductivity is observed for large applied electrical fields (E>10~5 V cm~(-1)) as found previously for V_2O_5 films.

机译：在这项工作中，我们介绍了两种扫描力显微镜（SFM）技术，这些技术应用于一端连接到金属电极的V_2O_5纳米纤维的电表征：首先是一种非接触式成像技术，结合了在选定点上的电流与电压曲线的采集以及第二种跳跃模式SFM，该模式可同时获取纳米级分辨率的地形图像和当前地图。确定纤维的电导率（约20 S cm〜（-1））和接触电阻（约62 M OMEGA）。如先前对于V_2O_5膜所发现的，对于大的施加电场（E> 10〜5 V cm〜（-1）），观察到电导率的非线性行为。

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《Nanotechnology》 |2003年第2期|共4页
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C Gomez-Navarro; P J de Pablo; J Colchero;
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1. Probing electrical transport in nanowires: current maps of individual V_2O_5 nanofibres with scanning force microscopy [J] . C Gomez-Navarro, P J de Pablo, J Colchero Nanotechnology . 2003,第2期

机译：探测纳米线中的电传输：带有扫描力显微镜的单个V_2O_5纳米纤维的电流图
2. Intrinsic current-voltage properties of nanowires with four-probe scanning tunneling microscopy: A conductance transition of ZnO nanowire [J] . X. Lin, X. B. He, T. Z. Yang, Applied Physics Letters . 2006,第4期

机译：四探针扫描隧道显微镜观察纳米线的内在电流-电压特性：ZnO纳米线的电导跃迁
3. Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy [J] . Wielgoszewski Grzegorz, Paletko Piotr, Tornaszewski Daniel, Micron: The international research and review journal for microscopy . 2015,第Null期

机译：通过扫描热显微镜和开尔文探针力显微镜研究硅纳米线中的载流子密度分布
4. Electrical properties of atomically controlled Si : P nanowires created by scanning probe microscopy [C] . F. J. RueB, K. E. J. Goh, Bent Weber, International Conference on the Physics of Semiconductors . 2007

机译：通过扫描探针显微镜创建的原子控制Si：P纳米线的电性能
5. Scanning Probe Microscopy and Electrical Transport Studies of Ferroelectric Thin Films and 2D van der Waals Materials [D] . Xiao, Zhiyong. 2017

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6. Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy [O] . Yi Lv, Jian Cui, Zuimin M Jiang, 2012

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7. The ORNL Lectures on Scanning Probe Microscopy, Part 2: The Force Dimension: Electronic and Ionic Transport Measurements via Kelvin Probe Force Microscopy [O] . Sergei V. Kalinin 2019

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Probing electrical transport in nanowires: current maps of individual V_2O_5 nanofibres with scanning force microscopy

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