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Manipulation of cadmium selenide nanorods with an atomic force microscope

机译：原子力显微镜对硒化镉纳米棒的处理

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We have used an atomic force microscope (AFM) to manipulate and study ligand-capped cadmium selenide nanorods deposited on highly oriented pyrolitic graphite (HOPG). The AFM tip was used to manipulate (i.e., translate and rotate) the nanorods by applying a force perpendicular to the nanorod axis. The manipulation result was shown to depend on the point of impact of the AFM tip with the nanorod and whether the nanorod had been manipulated previously. Forces applied parallel to the nanorod axis, however, did not give rise to manipulation. These results are interpreted by considering the atomic-scale interactions of the HOPG substrate with the organic ligands surrounding the nanorods. The vertical deflection of the cantilever was recorded during manipulation and was combined with a model in order to estimate the value of the horizontal force between the tip and nanorod during manipulation. This horizontal force is estimated to be on the order of a few tens of nN.
机译：我们已经使用原子力显微镜（AFM）来操纵和研究沉积在高度取向的热解石墨（HOPG）上的配体封端的硒化镉纳米棒。 AFM尖端用于通过施加垂直于纳米棒轴的力来操纵（即平移和旋转）纳米棒。已显示操纵结果取决于AFM尖端对纳米棒的撞击点以及纳米棒是否已被操纵过。但是，平行于纳米棒轴施加的力不会引起操纵。通过考虑HOPG底物与围绕纳米棒的有机配体的原子尺度相互作用来解释这些结果。在操作过程中记录悬臂的垂直挠度，并将其与模型结合以估算操作过程中尖端和纳米棒之间的水平力值。该水平力估计为几十nN。

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