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Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions

机译:高分辨率原子力显微镜的三维数据采集和分析程序

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摘要

Data acquisition and analysis procedures for noncontact atomic force microscopy that allow the recording of dense three-dimensional (3D) surface force and energy fields with atomic resolution are presented. The main obstacles for producing high-quality 3D force maps are long acquisition times that lead to data sets being distorted by drift, and tip changes. Both problems are reduced but not eliminated by low-temperature operation.
机译:介绍了用于非接触原子力显微镜的数据采集和分析程序,该程序允许以原子分辨率记录密集的三维(3D)表面力和能量场。生成高质量3D力图的主要障碍是获取时间长,这会导致数据集因漂移和尖端变化而失真。低温操作可以减少但不能消除这两个问题。

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