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Hysteresis contributions to the apparent gate pulse refreshing of carbon nanotube based sensors

机译:磁滞对基于碳纳米管的传感器的表观栅极脉冲刷新有贡献

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摘要

We have fabricated back-gated carbon nanotube (CNT) field effect transistors (FET) and used them to sense NH_3 (ammonia) gas. After observing the long time required for the sensor to recover after being exposed to NH_3, we attempted to accelerate the sensor recovery by pulsing the gate electrode for a period of time at an appropriate bias. We have found that most, if not all, of the apparent sensor refreshing due to the gate pulse is actually a measurement artifact resulting from device hysteresis.
机译:我们已经制造了背栅碳纳米管(CNT)场效应晶体管(FET),并使用它们来感测NH_3(氨)气。观察到传感器在暴露于NH_3后恢复所需的时间很长之后,我们尝试通过在适当的偏压下对栅电极脉冲一段时间来加速传感器的恢复。我们发现,由于门脉冲而引起的大多数(如果不是全部)传感器刷新,实际上是由器件滞后引起的测量伪像。

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