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首页> 外文期刊>Nanotechnology >Nanoscale domain switching behaviour in polycrystalline ferroelectric thin films
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Nanoscale domain switching behaviour in polycrystalline ferroelectric thin films

机译：多晶铁电薄膜中的纳米级畴切换行为

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摘要

We report on the nanoscale domain switching behaviour in polycrystalline tetragonal perovskite lead zirconate titanate (PZT) ferroelectric thin films investigated via piezoresponse force microscopy (PFM). Local domain structures were imaged as a function of varying biasing conditions and spatial location of the tip within 50-100 nm sized grains. Nanoscale piezoresponse images provided direct visual evidence of the complex interplay between electrical and mechanical fields in a polycrystalline system, which causes effects such as correlated switching between the grain of interest and neighbouring grains, ferroelastic domain switching, inhomogeneous piezostrain profiles and domain pinning on very minute length scales. Detailed investigations on mechanisms which induce such domain behaviour are presented.
机译：我们通过压电响应力显微镜（PFM）报告了多晶四方钙钛矿锆钛酸铅钛酸酯（PZT）铁电薄膜的纳米级域转换行为。将局部畴结构成像为在50-100 nm大小的晶粒内尖端变化的偏压条件和尖端空间位置的函数。纳米级压电响应图像为多晶系统中电场和机械场之间复杂的相互作用提供了直接的视觉证据，从而引起了诸如感兴趣的晶粒与相邻晶粒之间的相关转换，铁弹性域转换，不均匀的压电应变曲线以及在很短的时间内固定域的影响长度刻度。介绍了引起这种域行为的机制的详细研究。

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