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首页> 外文期刊>Nanotechnology >A novel variable temperature scanning nano-Hall probe microscope system for large area magnetic imaging incorporating piezoelectric actuators maintained at room temperature
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A novel variable temperature scanning nano-Hall probe microscope system for large area magnetic imaging incorporating piezoelectric actuators maintained at room temperature

机译：一种新型的可变温度扫描纳米霍尔探针显微镜系统，用于大面积磁成像，并装有保持在室温下的压电致动器

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摘要

A unique variable temperature scanning Hall probe system (VT-SHPM) has been developed for large area, nanometre scale lateral resolution imaging of ferromagnetic domains, in which piezoelectric actuators are maintained at ambient temperature and only the semiconducting micro-Hall probe and sample are cooled. Its design overcomes the limitations of conventional cryogenic SHPM systems, whgre the piezoelectric actuators are cooled thus reducing the maximum scan area to about 10 mu m X 10 mu m due to a reduction of the piezoelectric constant at cryogenic temperatures. The VT-SHPM operates between 300 and 77 K and consists of a liquid nitrogen glass Dewar housing the sample and the semiconducting micro-Hall probe (active area = 900 nm X 900 nm; magnetic sensitivity at 300 K 6 mG Hz~(1/2)) used to detect surface magnetic fields. The VT-SHPM was used to image perpendicularly magnetized domains at the surfaces of 5.5 mu m thick single crystal bismuth substituted garnet thin films between 300 and 77 K. Areas of about 120 mum X 130 mum were readily imaged by synchronizing the action of x-y piezoelectric actuators and corresponding stepper motors to move and scan the sample at a constant height of 0.25 mum over the surface of the micro-Hall probe. The average width of magnetic domains in the garnet thin films was found to increase as the measurement temperature decreased.
机译：已开发出独特的可变温度扫描霍尔探针系统（VT-SHPM），用于铁磁域的大面积，纳米级横向分辨率成像，其中压电致动器保持在环境温度下，仅半导体微霍尔探针和样品被冷却。它的设计克服了常规低温SHPM系统的局限性，在压电致动器冷却之后，由于在低温下压电常数的降低，最大扫描面积减小到约10μmX10μm。 VT-SHPM工作在300至77 K之间，由液氮玻璃杜瓦瓶（Dewar）容纳样品和半导体微霍尔探针（有效面积= 900 nm X 900 nm; 300 K时的磁灵敏度6 mG Hz〜（1 / 2））用于检测表面磁场。 VT-SHPM用于在300到77 K之间的5.5μm厚的单晶铋取代的石榴石薄膜表面上垂直磁化畴成像。通过同步xy压电的作用，可以轻松成像约120 m X 130 m的区域。致动器和相应的步进电机，以0.25毫米的恒定高度在微型霍尔探头表面上移动和扫描样品。发现石榴石薄膜中磁畴的平均宽度随测量温度的降低而增加。

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