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Deposition of ultrathin rare-earth doped Y_2O_3 phosphor films on alumina nanoparticles

机译：在氧化铝纳米粒子上沉积超薄稀土掺杂Y_2O_3荧光粉薄膜

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摘要

Ultrathin films of Eu~(3+) doped Y_2O_3 were deposited onto alumina nanoparticles using a unique solution synthesis method. The surface structure, composition, and morphology of the thin films deposited were analysed using high resolution transmission electron microscopy (TEM) and high angle annular dark field scanning TEM imaging and energy dispersive x-ray measurements. The films deposited were extremely thin, on the order of 3-5 nm, and uniformly covered all the alumina nanoparticles. X-ray diffraction was used to investigate the phases and structures of the thin films deposited. At the heat treatment temperature of 600 deg C, cubic Y_2O_3 nanocrystals were found in the film while as-coated layers exhibited mainly amorphous features. As the heat treatment temperature increased to 750 deg C, the amorphous thin film became well crystallized. Optical properties of Eu~(3+) doped Y_2O_3 films were characterized by fluorescence spectroscopy. Strong photoluminescence was observed in the sample annealed at 750 deg C, from the fluorescence of Eu~(3+) ions in a well-crystallized film, consistent with the x-ray diffraction and TEM observations.
机译：使用独特的溶液合成方法，将Eu〜（3+）掺杂Y_2O_3的超薄膜沉积到氧化铝纳米粒子上。使用高分辨率透射电子显微镜（TEM）和高角度环形暗场扫描TEM成像以及能量色散X射线测量来分析沉积的薄膜的表面结构，组成和形态。沉积的薄膜非常薄，约为3-5 nm，并均匀地覆盖了所有氧化铝纳米颗粒。 X射线衍射用于研究沉积的薄膜的相和结构。在600℃的热处理温度下，在膜中发现立方Y_2O_3纳米晶体，而被涂覆的层主要表现出非晶特征。随着热处理温度增加到750℃，非晶薄膜变得充分结晶。用荧光光谱法对Eu〜（3+）掺杂的Y_2O_3薄膜的光学性质进行了表征。在750℃退火的样品中，从良好结晶的膜中的Eu〜（3+）离子的荧光中观察到强光致发光，这与X射线衍射和TEM观察一致。

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