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In situ transmission electron microscopy investigation of the structural changes in carbon nanotubes during electron emission at high currents

机译：高电流电子发射过程中碳纳米管结构变化的原位透射电子显微镜研究

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摘要

The structural changes in carbon nanotubes under electron emission conditions were investigated in situ in a transmission electron microscope (TEM). The measurements were performed on individually mounted free-standing multi-walled carbon nanotubes (CNTs). It was found that the structure of the carbon nanotubes did not change gradually, as is the case with field emission electron sources made of sharp metal tips. Instead, changes occurred only above a current level of a few microamperes, which was different for each nanotube. Above the threshold current, carbon nanotubes underwent either structural damage, such as shortening and splitting of the apex of the nanotube, or closing of their open cap. The results are discussed on the basis of several models for degradation mechanisms.
机译：在电子发射条件下，碳纳米管的结构变化在透射电子显微镜（TEM）中进行了原位研究。在单独安装的独立式多壁碳纳米管（CNT）上进行测量。发现碳纳米管的结构没有逐渐改变，就像由尖锐的金属尖端制成的场发射电子源一样。取而代之的是，变化仅在几微安培的电流水平之上发生，这对于每个纳米管都是不同的。高于阈值电流，碳纳米管遭受结构破坏，例如纳米管顶点的缩短和裂开，或者其开放帽的闭合。在几种降解机理模型的基础上讨论了结果。

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