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首页> 外文期刊>Nanotechnology >Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip-sample interaction
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Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip-sample interaction

机译：MgO（001）薄膜上的调频原子力显微镜：原子图像分辨率的解析和尖端-样品相互作用的距离依赖性

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摘要

Atomically resolved images on a MgO(001) thin film deposited on Ag(001) obtained in ultrahigh vacuum by frequency modulated atomic force microscopy at low temperature are presented and analysed. Images obtained in the attractive regime show a different type of contrast formation from those acquired in the repulsive regime. For the interpretation of the image contrast we have investigated the tip - sample interaction. Force and energy were recovered from frequency shift versus distance curves. The derived force curves have been compared to the force laws of long-range, short-range and contact forces. In the attractive regime close to the minimum of the force - distance curve elastic deformations have been confirmed. The recovered energy curve has been scaled to the universal Rydberg model, yielding a decay length of l = 0.3 nm and DELTA EPSILON =4.2 aJ (26 eV) for the maximum adhesion energy. A universal binding-energy - distance relation is confirmed for the MgO(001) thin film.
机译：提出并分析了在超高真空下通过频率调制原子力显微镜在超高真空下获得的MgO（001）薄膜沉积在Ag（001）上的原子分辨图像。在吸引方案中获得的图像显示出与在排斥方案中获得的图像形成不同类型的对比度。为了解释图像对比度，我们研究了针尖-样品之间的相互作用。从频移对距离的曲线中恢复了力和能量。已将得出的力曲线与远距离，近距离和接触力的力定律进行了比较。在接近于力-距离曲线的最小值的吸引状态中，已经确认了弹性变形。恢复的能量曲线已按比例缩放到通用Rydberg模型，得出最大粘附能的衰减长度为l = 0.3 nm和DELTA EPSILON = 4.2 aJ（26 eV）。证实了MgO（001）薄膜具有普遍的结合能-距离关系。

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