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Enhancement of white luminescence from SiNx films by surface roughening

机译:通过表面粗糙化增强SiNx膜的白色发光

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摘要

White photoluminescence was obtained from multi- layered silicon nitride thin films prepared by plasma- enhanced chemical vapor deposition. The emission colors from single- layered silicon nitride films could be adjusted over the range of 440 - 660 nm by controlling the SiH4/ NH3 flow ratio during deposition. Surface roughening by anisotropic KOH etching of the Si( 100) substrate significantly improved the emission extraction efficiency and changed the color- rendering properties from the silicon nitride thin films. This was attributed to the suppression of internal reflection and interference effects from the thin films.
机译:从通过等离子体增强化学气相沉积制备的多层氮化硅薄膜获得白色光致发光。通过控制沉积过程中的SiH4 / NH3流量比,可以在440-660 nm的范围内调整单层氮化硅膜的发光颜色。 Si(100)衬底通过各向异性KOH蚀刻进行的表面粗糙处理显着提高了发射提取效率,并改变了氮化硅薄膜的显色性。这归因于抑制薄膜的内部反射和干涉效应。

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