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Au/SiO_2 nanocomposite film substrates with a high number density of Au nanoparticles for molecular conductance measurement

机译：具有高数量密度的Au纳米粒子的Au / SiO_2纳米复合薄膜基底用于分子电导测量

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摘要

Au/SiO_2 nanocomposite films consisting of an extremely high number density of Au nanoparticles dispersed in a SiO_2 matrix a few nanometres thick were deposited by a co-sputtering method, and employed for molecular conductance measurement by immobilizing and bridging conjugated biphenyl molecules on dispersed Au nanoparticles. The number density of Au nanoparticles in the insulating SiO_2 matrix was approximately 14000 mu m~(-2), and the average interparticle distance from their neighbours was about 8 nm. The current increased considerably up to the range of nanoamperes after the immobilization of the conjugated biphenyl molecules, 10~5 times larger than without molecules before immobilization. Although the Au nanoparticles can be connected to only 30 percent of all combinations of neighbouring Au nanoparticles by biphenyl molecules 2.4 nm long from the topological analysis, the biphenyl molecules can bridge most of the Au nanoparticles, and their bridging continuity is over 100 nm in length. Thus the measured current is suggested to come from the continuously bridged molecules between the Au nanoparticles. Furthermore the I-V data of the whole Au/SiO_2 nanocomposite film immobilized with conjugated molecules are confirmed to be in a reasonable range in comparison with the scanning tunnelling spectroscopy data of similar conjugated molecules.
机译：通过共溅射方法沉积由几纳米厚的SiO_2基质中分散的极高密度的Au纳米颗粒组成的Au / SiO_2纳米复合膜，并通过将共轭联苯分子固定并桥接在分散的Au纳米颗粒上用于分子电导测量。绝缘SiO_2基体中Au纳米粒子的数量密度约为14000μm〜（-2），与相邻粒子的平均粒子间距离约为8 nm。固定化共轭联苯分子后，电流显着增加至纳安范围，比固定前没有分子大10至5倍。尽管从拓扑分析来看，Au纳米粒子只能通过2.4 nm长的联苯分子与相邻的Au纳米粒子的所有组合中的30％相连，但是联苯分子可以桥接大多数Au纳米粒子，并且其桥接连续性的长度超过100 nm 。因此，建议测量的电流来自Au纳米颗粒之间的连续桥连分子。此外，与类似共轭分子的扫描隧道光谱数据相比，被共轭分子固定的整个Au / SiO_2纳米复合膜的I-V数据在合理范围内。

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