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Cobalt silicide nanocables grown on Co films: Synthesis and physical properties

机译:在钴膜上生长的硅化钴纳米电缆:合成和物理性质

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Single-crystalline cobalt silicide/SiO_x nanocables have been grown on Co thin films on an SiO_2 layer by a self-catalysis process via vapor-liquid-solid mechanism. The nanocables consist of a core of CoSi nanowires and a silicon oxide shell with a length of several tens of micrometers. In the confined space in the oxide shell, the CoSi phase is stable and free from agglomeration in samples annealed in air ambient at 900 °C for 1 h. The nanocable structure came to a clear conclusion that the thermal stability of the silicide nanowires can be resolved by the shell encapsulation. Cobalt silicide nanowires were obtained from the nanocable structure. The electrical properties of the CoSi nanowires have been found to be compatible with their thin film counterpart and a high maximum current density of the nanowires has been measured. One way to obtain silicate nanowires has been demonstrated. The silicate compound, which is composed of cobalt, silicon and oxygen, was achieved. The Co silicide/oxide nanocables are potentially useful as a key component of silicate nanowires, interconnects and magnetic units in nanoelectronics.
机译:单晶硅化钴/ SiO_x纳米电缆已经通过气液固机理通过自催化过程在SiO_2层上的Co薄膜上生长。纳米电缆由CoSi纳米线的芯和长度为几十微米的氧化硅壳组成。在氧化物壳的密闭空间中,CoSi相稳定且在空气中在900°C的环境中退火1小时的样品中不会发生团聚。纳米电缆结构得出明确的结论,即硅化物纳米线的热稳定性可以通过壳包封解决。从纳米电缆结构获得硅化钴纳米线。已经发现CoSi纳米线的电特性与其薄膜对应物相容,并且已经测量了纳米线的高的最大电流密度。已经证明了获得硅酸盐纳米线的一种方法。获得了由钴,硅和氧组成的硅酸盐化合物。硅化钴/氧化物钴纳米电缆潜在地可用作纳米电子学中硅酸盐纳米线,互连和磁性单元的关键组件。

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