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首页> 外文期刊>Neuron >Extent of voltage sensor movement during gating of shaker K+ channels.
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Extent of voltage sensor movement during gating of shaker K+ channels.

机译:振动器K +通道门控期间电压传感器的移动程度。

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摘要

Voltage-driven activation of Kv channels results from conformational changes of four voltage sensor domains (VSDs) that surround the K(+) selective pore domain. How the VSD helices rearrange during gating is an area of active research. Luminescence resonance energy transfer (LRET) is a powerful spectroscopic ruler uniquely suitable for addressing the conformational trajectory of these helices. Using a geometric analysis of numerous LRET measurements, we were able to estimate LRET probe positions relative to existing structural models. The experimental movement of helix S4 does not support a large 15-20 A transmembrane paddle-type Rather, our measurements demonstrate a moderate S4 displacement of 10 +/- 5 A, with a vertical component of 5 +/- 2 A. The S3 segment moves 2 +/- 1 A in the opposite direction and is therefore not moving as an S3-S4 rigid body.
机译:Kv通道的电压驱动激活是由包围K(+)选择性孔结构域的四个电压传感器域(VSD)的构象变化引起的。门控期间VSD螺旋如何重新排列是一个积极研究的领域。发光共振能量转移(LRET)是一种功能强大的光谱尺,特别适用于解决这些螺旋的构象轨迹。使用大量LRET测量的几何分析,我们能够估计LRET探针相对于现有结构模型的位置。螺旋S4的实验运动不支持较大的15-20 A跨膜桨式,而是,我们的测量结果表明S4的位移为10 +/- 5 A,垂直分量为5 +/- 2A。S3扇形段沿相反方向移动2 +/- 1 A,因此不会像S3-S4刚体那样移动。

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