Double-exposure holographic interferometry technique used for characterization of electrodeposited cobalt oxide thin films

Thokale RN.; Patil PS.; Dongare MB.

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Double-exposure holographic interferometry technique used for characterization of electrodeposited cobalt oxide thin films

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Double-exposure holographic interferometry (DEHI) technique was used to study the surface deformation of stainless steel substrate, when cobalt oxide was deposited onto it using dc electrodeposition method. The films were deposited by varying the concentrations of CoCl2 solution and the deposition time. It was observed that interference fringes were localized on the surface of substrate when the hologram was transilluminated. It was further noticed that the fringe spacing changes with solution concentration as well as time of deposition. The thickness of deposited film, mass of cobalt oxide deposited on the substrate and rate of mass deposition were evaluated. (C) 2002 Elsevier Science B.V. All rights reserved. References: 19

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《Materials Chemistry and Physics》 |2002年第2期|143-149|共7页
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Thokale RN.; Patil PS.; Dongare MB.;
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作者单位

Project Leader,Animal Health and Welfare,Cheshire County Council;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种英语
中图分类工程材料学;工程基础科学;
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Double-exposure holographic interferometry technique used for characterization of electrodeposited cobalt oxide thin films

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