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High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles

机译:使用SEM / T-SEM,EDX和SAM进行高分辨率成像,这是一种结合的方法学方法,可对单个工程纳米颗粒进行形态学和元素分析

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摘要

The combination of complementary characterization techniques such as SEM (Scanning Electron Microscopy), T-SEM (Scanning Electron Microscopy in Transmission Mode), EDX (Energy Dispersive X-ray Spectroscopy) and SAM (Scanning Auger Microscopy) has been proven to be a powerful and relatively quick characterization strategy for comprehensive morphological and chemical characterization of individual silica and titania nanoparticles. The selected "real life" test materials, silica and titania, are listed in the OECD guidance manual as representative examples because they are often used as commercial nanomaterials. Imaging by high resolution SEM and in the transmission mode by T-SEM allows almost simultaneous surface and in-depth inspection of the same particle using the same instrument. EDX and SAM enable the chemical characterization of bulk and surface of individual nanoparticles. The core-shell properties of silica based materials are addressed as well. Titania nominally coated by silane purchased from an industrial source has been found to be inhomogeneous in terms of chemical composition.
机译:事实证明,互补性表征技术(例如SEM(扫描电子显微镜),T-SEM(透射模式的扫描电子显微镜),EDX(能量色散X射线光谱)和SAM(扫描俄歇显微镜)的组合非常有效。相对快速的表征策略,可对单个二氧化硅和二氧化钛纳米颗粒进行全面的形态和化学表征。 OECD指南手册中将选定的“现实生活”测试材料二氧化硅和二氧化钛列为代表性示例,因为它们经常被用作商业纳米材料。通过高分辨率SEM成像并通过T-SEM以透射模式成像,几乎可以同时使用同一台仪器对同一粒子进行表面和深度检查。 EDX和SAM可以对单个纳米颗粒的体积和表面进行化学表征。还解决了基于二氧化硅的材料的核-壳性质。已经发现名义上由从工业来源购买的硅烷涂覆的二氧化钛在化学组成方面是不均匀的。

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